Williams, David B.  1949- <br/><br/>
Transmission electron microscopy :  a textbook for materials science-Part 2 / 
David B. Williams, C. Barry Carter. 
 - 2nd ed. 
 - New York :  Springer,  2008. 
 - lxii, 197- 368 p. :  ill;  27cm 
<br/><br/>Includes bibliographical references and index. 
<br/><br/>pt. 1. Basics -- pt. 2. Diffraction -- pt. 3. Imaging -- pt. 4. Spectrometry 
<br/><br/><label>ISBN: </label>9780387765006 (hardcover : alk. paper) 
<br/><br/><label>LCCN: </label>2008-941103 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials--Microscopy.<br/>Transmission electron microscopy.
<br/><br/><label>Subjects--Index Terms: </label>Vật liệu Kính hiển vi 
<br/><br/><label>LC Class. No.: </label>TA417.23  / .W56 2009 
<br/><br/><label>Dewey Class. No.: </label>502/.825  / WIL(2) 2008