Freund, L. B. <br/><br/>
Thin film materials :  stress, defect formation, and surface evolution / 
L.B. Freund, S. Suresh. 
 - 1st pbk. ed. 
 - Cambridge, [England] ; New York :  Cambridge University Press,  2009. 
 - xviii, 750 p. :  ill. ;  25 cm. 
<br/><br/>Includes bibliographical references (p. 713-737) and indexes. 
<br/><br/><label>ISBN: </label>9780521529778 
<br/><br/><label>LCCN: </label>2009-289764 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films.<br/>Electronics.<br/>Mechatronics Engineering Technology<br/>Kỹ thuật điện<br/>Phim mỏng<br/>Điện tử
<br/><br/><label>LC Class. No.: </label>TA418.9.T45  / F74 2009 
<br/><br/><label>Dewey Class. No.: </label>621.38152  / FRE 2009