Scanning microscopy for nanotechnology :  techniques and applications / 
edited by Weilie Zhou and Zhong Lin Wang. 
 - New York :  Springer,  2007. 
 - xiv, 522 p., [12] p. of plates :  ill. (some col.) ;  24 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9780387333250 (cased) 0387333258 (cased) 
<br/><br/><label>LCCN: </label>2006-925865 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning electron microscopy.<br/>Nanotechnology.
<br/><br/><label>Subjects--Index Terms: </label>Kính hiển vi Công nghệ nanô 
<br/><br/><label>LC Class. No.: </label>QH212.S3  / S346 2007 
<br/><br/><label>Dewey Class. No.: </label>502.825  / SCA 2007