In-situ electron microscopy :  applications in physics, chemistry and materials science / 
edited by Gerhard Dehm, James M. Howe, and Josef Zweck. 
 - Weinheim :  Wiley-VCH,  c2012. 
 - xviii, 383 p. :  ill. (some col.) ;  25 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9783527319732 (alk. paper) 3527319735 (alk. paper) 
<br/><br/><label>LCCN: </label>2012-471513 
<br/><br/><label>Nat. Bib. No.: </label>GBB204472  bnb 
<br/><br/><label>Nat. Bib. Agency Control No.: </label>016010209  Uk 
<br/><br/><label>Subjects--Personal Names: </label><br/>Elektronenmikroskopie.<br/>In situ.
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy.
<br/><br/><label>Subjects--Index Terms: </label>Điện tử Kính hiển vi 
<br/><br/><label>LC Class. No.: </label>QH212.E4  / I5 2012 
<br/><br/><label>Dewey Class. No.: </label>502.8  / INS 2012