TY  - BOOK
AU  - Dehm,Gerhard
AU  - Howe,James M.
AU  - Zweck,Josef
TI  - In-situ electron microscopy: applications in physics, chemistry and materials science 
SN  - 9783527319732 (alk. paper)
AV  - QH212.E4 I5 2012
U1  - 502.8 23
PY  - 2012///
CY  - Weinheim
PB  - Wiley-VCH
KW  - Elektronenmikroskopie.
KW  - In situ.
KW  - Electron microscopy
KW  - Điện tử
KW  - Kính hiển vi
N1  - Includes bibliographical references and index
ER  -