Recombination lifetime measurements in silicon / 
Ed. : Dinesh C. Gupta, Fred R. Bacher, William M. Hughes 
 - West Conshohocken, PA :  ASTM,  1998 
 - 392 p. :  ill. ;  24 cm. 
<br/><br/><label>ISBN: </label>0803124899 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Testing--Congresses.<br/>Service life (Engineering)--Forecasting--Congresses.<br/>Electronic measurements--Congresses.
<br/><br/><label>Subjects--Index Terms: </label>Chất bán dẫn Vô tuyến điện Đo điện tử 
<br/><br/><label>Dewey Class. No.: </label>621.3815/2  / REC 1998