Watts, John F. <br/><br/>
An introduction to surface analysis by XPS and AES / 
John F. Watts, John Wolstenholme. 
 - Chichester, West Sussex, England ;  New York :  J. Wiley,  c2003. 
 - x, 212 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references (p. [195]-202) and index. 
<br/><br/><label>ISBN: </label>0470847123 (cloth : alk. paper) 0470847131 (pbk. : alk. paper) 
<br/><br/><label>LCCN: </label>2002-153114 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron spectroscopy.<br/>Surfaces (Technology)--Analysis.
<br/><br/><label>Subjects--Index Terms: </label>Kính hiển vi điện tử Phân tích bề mặt 
<br/><br/><label>LC Class. No.: </label>TP156.S95  / W373 2003 
<br/><br/><label>Dewey Class. No.: </label>620/.44  / WAT 2003