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Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer.

By: Contributor(s): Material type: TextTextLanguage: English Publication details: New York, N.Y. ; London : Springer, c2007.Description: xiv, 336 p. : ill. ; 25 cmISBN:
  • 9780387292601 (hbk.)
  • 0387292608 (hbk.)
  • 0387292616 (e-book)
  • 9780387292618 (e-book)
Subject(s): DDC classification:
  • 621.3815/2 ALF 2007 22
LOC classification:
  • QC176.83 .A44 2006
Online resources:
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Holdings
Item type Current library Call number Copy number Status Date due Barcode
Sách, chuyên khảo, tuyển tập Phòng DVTT KHTN & XHNV Kho Tự nhiên tham khảo 621.3815/2 ALF 2007 (Browse shelf(Opens below)) 1 Available 01111000052

Includes bibliographical references and index.

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