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In-situ electron microscopy : applications in physics, chemistry and materials science / edited by Gerhard Dehm, James M. Howe, and Josef Zweck.

Contributor(s): Material type: TextTextLanguage: English Publication details: Weinheim : Wiley-VCH, c2012.Description: xviii, 383 p. : ill. (some col.) ; 25 cmISBN:
  • 9783527319732 (alk. paper)
  • 3527319735 (alk. paper)
Subject(s): DDC classification:
  • 502.8 INS 2012 23
LOC classification:
  • QH212.E4 I5 2012
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Holdings
Item type Current library Call number Status Date due Barcode
Sách, chuyên khảo, tuyển tập Phòng DVTT KHTN & XHNV Kho tài liệu chiến lược 502.8 INS 2012 (Browse shelf(Opens below)) Available 01071000715

Includes bibliographical references and index.

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