000 01248nam a2200397 a 4500
001 vtls000059902
003 VRT
005 20240802173443.0
008 101207s2005 gw rb 000 0 eng d
020 _a352740502X
035 _aVNU050069175
039 9 _a201705101018
_bhaultt
_c201502080335
_dVLOAD
_y201012070324
_zVLOAD
041 _aeng
044 _aDE
082 0 4 _a620.50287
_bNAN 2005
_222
090 _a620.5
_bNAN 2005
245 0 0 _aNanoscale calibration standards and methods :
_bdimensional and related measurements in the micro- and nanometer range /
_cEd. : Günter Wilkening, Ludger Koenders
260 _aWeinheim :
_bWiley-VCH,
_c2005
300 _a519 p.
650 0 _aNanostructured materials
_xMeasurement
_vCongresses
650 0 _aMicrostructure
_xMeasurement
_vCongresses.
650 0 _aScientific apparatus and instruments
_xCalibration
_vCongresses.
650 0 _aStereology
_vCongresses.
653 _aCông nghệ Nano
653 _aDụng cụ đo
653 _aHệ đo lường
653 _aSố đo
700 1 _aKoenders, Ludger,
_eeditor
700 1 _aWilkening, Günter,
_eeditor
900 _aTrue
911 _aHoàng Yến
925 _aG
926 _a0
927 _aSH
942 _1
999 _c313557
_d313557