000 01172nam a2200397 a 4500
001 vtls000003551
003 VRT
005 20240802184359.0
008 101206s1981 nyu rb 000 0 eng d
035 _aVNU970003657
039 9 _a201808141606
_bhaianh
_c201608231204
_dhaianh
_c201504270038
_dVLOAD
_c201504241418
_dVLOAD
_y201012061526
_zVLOAD
040 _aVNU
041 1 _aeng
044 _aUS
082 0 4 _a621.36/73
_bLOW 1981
_223
090 _a621.36
_bLOW 1981
094 _a31.4
245 0 0 _aLow Energy X-ray diagnostics 1981 :
_bMonterey /
_cedited by David T. Attwood, Burton L. Henke.
260 _aNew York :
_bAmerican Institute of Physics ,
_c1981
300 _a396 tr.
650 0 0 _aDiagnosis, Radioscopic
_xCongresses
650 0 0 _aX-rays
_xIndustrial applications
_xCongresses.
650 0 0 _aX-rays
_xCongresses.
650 0 0 _aX-Quang
_xỨng dụng công nghiệp
_xChẩn đoán
650 0 0 _aMechatronics Engineering Technology
653 _aEnergy
653 _aLow energy
900 _aTrue
911 _aL.B.Lâm
912 _aN.V.Hành
925 _aG
926 _a0
927 _aSH
928 _abAL34M1
942 _c1
999 _c341099
_d341099