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| 008 | 130418s2012 gw a b 001 0 eng d | ||
| 010 | _a2012-471513 | ||
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_a016010209 _2Uk |
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| 020 | _a9783527319732 (alk. paper) | ||
| 020 | _a3527319735 (alk. paper) | ||
| 020 | _z9783527652198 (ePDF) | ||
| 020 | _z9783527652181 (ePub) | ||
| 020 | _z9783527652174 (mmobi) | ||
| 020 | _z953527652157 (oBook) | ||
| 035 | _a(OCoLC)ocn773431415 | ||
| 035 | _a17476972 | ||
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_a502.8 _bINS 2012 _223 |
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_a502.8 _bINS 2012 |
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_aIn-situ electron microscopy : _bapplications in physics, chemistry and materials science / _cedited by Gerhard Dehm, James M. Howe, and Josef Zweck. |
| 260 |
_aWeinheim : _bWiley-VCH, _cc2012. |
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| 300 |
_axviii, 383 p. : _bill. (some col.) ; _c25 cm. |
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| 504 | _aIncludes bibliographical references and index. | ||
| 600 | 1 | 7 |
_aElektronenmikroskopie. _2swd |
| 600 | 1 | 7 |
_aIn situ. _2swd |
| 650 | 0 | _aElectron microscopy. | |
| 653 | _aĐiện tử | ||
| 653 | _aKính hiển vi | ||
| 700 | 1 | _aDehm, Gerhard. | |
| 700 | 1 |
_aHowe, James M., _d1955- |
|
| 700 | 1 | _aZweck, Josef. | |
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| 911 | _aNguyễn Bích Hạnh | ||
| 912 | _aHoàng Yến | ||
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_aacquire _b2 shelf copies _xpolicy default |
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