Recombination lifetime measurements in silicon / Ed. : Dinesh C. Gupta, Fred R. Bacher, William M. Hughes

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Material type: Text

TextLanguage: English Publication details: West Conshohocken, PA : ASTM, 1998Description: 392 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Sách, chuyên khảo, tuyển tập	Phòng DVTT KHTN & XHNV Kho Tự nhiên tham khảo	621.3815/2 REC 1998 (Browse shelf(Opens below))	1	Available		AV-D1/01458
Sách, chuyên khảo, tuyển tập	Phòng DVTT KHTN & XHNV Kho Tự nhiên tham khảo	621.3815/2 REC 1998 (Browse shelf(Opens below))	1	Available		AV-D1/01459

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